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S00500 - SEMI S5 - Safety Guideline for Sizing and Identifying Flow Limiting Devices for Gases StdTpc-Package & Chip Carrier Tooling NOTE 1: Repeated exposure to

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Description

NOTE 1: Repeated exposure to deep UV (DUV) illumination is known to alter the light scattering response of PSL sphere depositions

This Standard is intended to eliminate confusion and provide for a common language which users and manufacturers can employ to discuss MFC/MFM calibration

The purpose of this document is to provide a guide for the design

半導体製造作業から排出されるガス状及び粒子状汚染物質の放出を"配管終端"において削減するため考えられる方法

SEMI M64-0915 (Reapproved 0422)

S00500 - SEMI S5 - Safety Guideline for Sizing and Identifying Flow Limiting Devices for Gases StdTpc-Package & Chip Carrier Tooling NOTE 1: Repeated exposure toThe purpose of this Safety Guideline is to provide information and methods related to flow limiting devices (FLDs) that limit the rate of release of hazardous gases during transportation, storage, and use. This Safety Guideline pertains to FLDs for hazardous gases. These devices are intended to limit the flow rate of uncontrolled releases of gases at or downstream of the FLDs. This Safety Guideline pertains to FLDs operating at critical flow rates

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