ME139200 - SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces StdTpc-FPD Polarizing Films This Document describes a test

This Document describes a test method to characterize ‘as received’ surface composition and chemistry encompassing all chromium-enriched stainless steel surfaces in tubing

This Test Method defines the equipment and measurement procedure for visually detecting the surface defects of GaN epitaxial wafer for manufacturing high brightness LEDs

Refer to § 9 for a description of the SEMI E30 provisions

3-0698 (first published)

Use of P-V metric is specified for Nanotopography quantification

ME139200 - SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces StdTpc-FPD Polarizing Films This Document describes a testThis Guide explains a procedure for the determination of the amount and angular distribution of optical scatter from an opaque surface. In particular it focuses on measurement of the BRDF, which is a convenient and well accepted means of expressing optical scatter levels for many purposes. Additional data presentation formats described in Related Information 1 have advantages for certain applications. Surface parameters can be calculated from optical