Pay in 4 interest-free payments of $29.00 Learn more
Ships within 48 hours · Estimated delivery Sep 12 - Sep 17
Who is BS 9940-04
especially significant for dense-WDM (DWDM) systems
9 Maintenance
It is intended
BS EN 60079-11 covers electrical equipment and components sitting outside explosive gas atmospheres or protected by another type of protection – as specified in BS EN 60079-0 – too
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer Ingestion-build-67170 Who is BS 9940-041 Scope This Technical Report describes a method for determining ion sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X ray photoelectron spectroscopy (XPS) where the specimen is ion sputtered over a region with an area between 0,4 mm2 and 3,0 mm2. This Technical Report is applicable only to a laterally homogeneous bulk or single layered material where the ion sputtering rate is determined from the sputtered